Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

S Dobosz; H Stabile; A Tortora; P Monot; F Réau; M Bougeard; H Merdji; B Carré; Ph Martin; D Joyeux; D Phalippou; F Delmotte; J Gautier; R Mercier

doi:10.1063/1.3257676

Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

Rev Sci Instrum. 2009 Nov;80(11):113102. doi: 10.1063/1.3257676.

Authors

S Dobosz¹, H Stabile, A Tortora, P Monot, F Réau, M Bougeard, H Merdji, B Carré, Ph Martin, D Joyeux, D Phalippou, F Delmotte, J Gautier, R Mercier

Affiliation

¹ CEA, IRAMIS, Service des Photons Atomes et Molécules, F-91191 Gif- sur-Yvette, France. sandrine.dobosz-dufrenoy@cea.fr

PMID: 19947712
DOI: 10.1063/1.3257676

Abstract

We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3x10(20) cm(-3) 1.1 ns after the creation of a plasma on aluminum target.