Pore-scale evaporation-condensation dynamics resolved by synchrotron x-ray tomography

Phys Rev E Stat Nonlin Soft Matter Phys. 2012 Jan;85(1 Pt 2):016317. doi: 10.1103/PhysRevE.85.016317. Epub 2012 Jan 23.

Abstract

Capillary processes greatly influence vapor mediated transport dynamics and associated changes in liquid phase content of porous media. Rapid x-ray synchrotron tomography measurements were used to resolve liquid-vapor interfacial dynamics during evaporation and condensation within submillimetric pores forming between sintered glass bead samples subjected to controlled ambient temperature and relative humidity. Evolution of gas-liquid interfacial shapes were in agreement with predictions based on our analytical model for interfacial dynamics in confined wedge-shaped pores. We also compared literature experimental data at the nanoscale to illustrate the capability of our model to describe early stages of condensation giving rise to the onset of capillary forces between rough surfaces. The study provides high resolution, synchrotron-based observations of capillary evaporation-condensation dynamics at the pore scale as the confirmation of the pore scale analytical model for capillary condensation in a pore and enables direct links with evolution of macroscopic vapor gradients within a sintered glass bead sample through their effect on configuration and evolution of the local interfaces. Rapid condensation processes play a critical role in the onset of capillary-induced friction affecting mechanical behavior of physical systems and industrial applications.

Publication types

  • Research Support, Non-U.S. Gov't