Layout and results from the initial operation of the high-resolution x-ray imaging crystal spectrometer on the Large Helical Device

N A Pablant; M Bitter; L Delgado-Aparicio; M Goto; K W Hill; S Lazerson; S Morita; A L Roquemore; D Gates; D Monticello; H Nielson; A Reiman; M Reinke; J E Rice; H Yamada

doi:10.1063/1.4744935

Layout and results from the initial operation of the high-resolution x-ray imaging crystal spectrometer on the Large Helical Device

Rev Sci Instrum. 2012 Aug;83(8):083506. doi: 10.1063/1.4744935.

Authors

N A Pablant¹, M Bitter, L Delgado-Aparicio, M Goto, K W Hill, S Lazerson, S Morita, A L Roquemore, D Gates, D Monticello, H Nielson, A Reiman, M Reinke, J E Rice, H Yamada

Affiliation

¹ Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.

PMID: 22938293
DOI: 10.1063/1.4744935

Abstract

First results of ion and electron temperature profile measurements from the x-ray imaging crystal spectrometer (XICS) diagnostic on the Large Helical Device (LHD) are presented. This diagnostic system has been operational since the beginning of the 2011 LHD experimental campaign and is the first application of the XICS diagnostic technique to helical plasma geometry. The XICS diagnostic provides measurements of ion and electron temperature profiles in LHD with a spatial resolution of 2 cm and a maximum time resolution of 5 ms (typically 20 ms). Ion temperature profiles from the XICS diagnostic are possible under conditions where charge exchange recombination spectroscopy (CXRS) is not possible (high density) or is perturbative to the plasma (low density or radio frequency heated plasmas). Measurements are made by using a spherically bent crystal to provide a spectrally resolved 1D image of the plasma from line integrated emission of helium-like Ar(16 +). The final hardware design and configuration are detailed along with the calibration procedures. Line-integrated ion and electron temperature measurements are presented, and the measurement accuracy is discussed. Finally central temperature measurements from the XICS system are compared to measurements from the Thomson scattering and CXRS systems, showing excellent agreement.