Tip-enhanced Raman scattering for atomic-scale spectroscopy and imaging

Nat Rev Phys. 2023;5(1):10.1038/s42254-022-00537-0. doi: 10.1038/s42254-022-00537-0.

¹ Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

Abstract