Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):813-814.
doi: 10.1093/micmic/ozad067.404.
Authors
Yimeng Chen
1
,
Isabelle Martin
1
,
Ty Prosa
1
,
Robert Ulfig
1
,
Katherine P Rice
1
,
David J Larson
1
,
David A Reinhard
1
,
Dan Lenz
1
,
Nicholas R Brewer
1
,
Michael Holman
1
,
Jacob Hanna
1
,
Gard Groth
1
,
Avnish Singh Pal
2
,
Joysurya Basu
2
Affiliations
1
CAMECA Instruments Inc., Madison, WI, United States.
2
National Electron Microscope Facility, Department of Metallurgical Engineering, IIT (BHU), Varanasi, India.
PMID:
37613735
DOI:
10.1093/micmic/ozad067.404
No abstract available