Characterizing TeO2 Formation in CdTe Devices Using Transmission Electron Microscopy
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1661-1662.
doi: 10.1093/micmic/ozad067.855.
Authors
John Farrell
1
,
Ebin Bastola
2
,
Manoj Jamarkattel
2
,
Michael Heben
2
,
Walajabad S Sampath
3
,
James Sites
3
,
Robert F Klie
1
Affiliations
1
University of Illinois at Chicago, Chicago, IL, United States.
2
University of Toledo, Toledo, OH, United States.
3
Colorado State University, Fort Collins, CO, United States.
PMID:
37613957
DOI:
10.1093/micmic/ozad067.855
No abstract available