On the determination of crystalline silica in the presence of amorphous silica
Ann Occup Hyg
.
1980;23(4):329-34.
doi: 10.1093/annhyg/23.4.329.
Authors
E Bye
,
G Edholm
,
B Gylseth
,
D G Nicholson
PMID:
6266326
DOI:
10.1093/annhyg/23.4.329
No abstract available
MeSH terms
Crystallization
Silicon Dioxide / analysis*
Spectrophotometry, Infrared
X-Ray Diffraction
Substances
Silicon Dioxide