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Correction to "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography".
Vidas L, Günther CM, Miller TA, Pfau B, Perez-Salinas D, Martínez E, Schneider M, Gührs E, Gargiani P, Valvidares M, Marvel RE, Hallman KA, Haglund RF Jr, Eisebitt S, Wall S. Vidas L, et al. Among authors: hallman ka. Nano Lett. 2021 Sep 8;21(17):7426. doi: 10.1021/acs.nanolett.1c03109. Epub 2021 Aug 19. Nano Lett. 2021. PMID: 34410135 No abstract available.
Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography.
Vidas L, Günther CM, Miller TA, Pfau B, Perez-Salinas D, Martínez E, Schneider M, Gührs E, Gargiani P, Valvidares M, Marvel RE, Hallman KA, Haglund RF Jr, Eisebitt S, Wall S. Vidas L, et al. Among authors: hallman ka. Nano Lett. 2018 Jun 13;18(6):3449-3453. doi: 10.1021/acs.nanolett.8b00458. Epub 2018 May 18. Nano Lett. 2018. PMID: 29767985
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