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Lee E, VahidMohammadi A, Prorok BC, Yoon YS, Beidaghi M, Kim DJ.Lee E, et al. Among authors: kim dj.ACS Appl Mater Interfaces. 2017 Oct 25;9(42):37184-37190. doi: 10.1021/acsami.7b11055. Epub 2017 Oct 11.ACS Appl Mater Interfaces. 2017.PMID: 28953355
Lee E, Yoon YS, Kim DJ.Lee E, et al. Among authors: kim dj.ACS Sens. 2018 Oct 26;3(10):2045-2060. doi: 10.1021/acssensors.8b01077. Epub 2018 Oct 15.ACS Sens. 2018.PMID: 30270624Review.
Lee E, Lee D, Yoon J, Yin Y, Lee YN, Uprety S, Yoon YS, Kim DJ.Lee E, et al. Among authors: kim dj.Sensors (Basel). 2018 Oct 5;18(10):3334. doi: 10.3390/s18103334.Sensors (Basel). 2018.PMID: 30301181Free PMC article.
Lee E, VahidMohammadi A, Yoon YS, Beidaghi M, Kim DJ.Lee E, et al. Among authors: kim dj.ACS Sens. 2019 Jun 28;4(6):1603-1611. doi: 10.1021/acssensors.9b00303. Epub 2019 Jun 19.ACS Sens. 2019.PMID: 31244007
Shahi N, Lee E, Min B, Kim DJ.Shahi N, et al. Among authors: kim dj.Sensors (Basel). 2021 Jun 28;21(13):4415. doi: 10.3390/s21134415.Sensors (Basel). 2021.PMID: 34203163Free PMC article.
Das G, Choi JH, Nguyen PKT, Kim DJ, Yoon YS.Das G, et al. Among authors: kim dj.Polymers (Basel). 2022 Mar 16;14(6):1197. doi: 10.3390/polym14061197.Polymers (Basel). 2022.PMID: 35335528Free PMC article.Review.
Wu G, Du H, Lee D, Cha YL, Kim W, Zhang X, Kim DJ.Wu G, et al. Among authors: kim w, kim dj.ACS Appl Mater Interfaces. 2022 Dec 21;14(50):56056-56064. doi: 10.1021/acsami.2c15443. Epub 2022 Dec 12.ACS Appl Mater Interfaces. 2022.PMID: 36507693
Neelakandan DP, Kim W, Prorok BC, Mirkoohi E, Kim DJ, Liaw PK, Song G, Lee C.Neelakandan DP, et al. Among authors: kim w, kim dj.Micromachines (Basel). 2024 Jan 19;15(1):148. doi: 10.3390/mi15010148.Micromachines (Basel). 2024.PMID: 38276847Free article.
Kim W, Lee D, Wu G, Cha YL, Moazzem MS, Cho S, Kim DJ.Kim W, et al. Among authors: kim dj.ACS Sens. 2023 Apr 28;8(4):1542-1549. doi: 10.1021/acssensors.2c02616. Epub 2023 Apr 16.ACS Sens. 2023.PMID: 37061942
Yoo C, Yoon J, Kaium MG, Osorto B, Han SS, Kim JH, Kim BK, Chung HS, Kim DJ, Jung Y.Yoo C, et al. Among authors: kim dj, kim bk, kim jh.Nanotechnology. 2022 Aug 30;33(47). doi: 10.1088/1361-6528/ac8811.Nanotechnology. 2022.PMID: 35944420