Verbeeck J - Search Results

1

Evaluation of different rectangular scan strategies for STEM imaging.

Velazco A, Nord M, Béché A, Verbeeck J. Velazco A, et al. Among authors: verbeeck j. Ultramicroscopy. 2020 Aug;215:113021. doi: 10.1016/j.ultramic.2020.113021. Epub 2020 May 21. Ultramicroscopy. 2020. PMID: 32485392

2

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: verbeeck j. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

3

Model-based quantification of EELS spectra: Including the fine structure.

Verbeeck J, Van Aert S, Bertoni G. Verbeeck J, et al. Ultramicroscopy. 2006 Oct-Nov;106(11-12):976-80. doi: 10.1016/j.ultramic.2006.05.006. Epub 2006 Jun 30. Ultramicroscopy. 2006. PMID: 16843599

4

Accuracy and precision in model based EELS quantification.

Bertoni G, Verbeeck J. Bertoni G, et al. Among authors: verbeeck j. Ultramicroscopy. 2008 Jul;108(8):782-90. doi: 10.1016/j.ultramic.2008.01.004. Epub 2008 Feb 5. Ultramicroscopy. 2008. PMID: 18329173

5

Tomographic spectroscopic imaging; an experimental proof of concept.

Van den Broek W, Verbeeck J, Schryvers D, De Backer S, Scheunders P. Van den Broek W, et al. Among authors: verbeeck j. Ultramicroscopy. 2009 Mar;109(4):296-303. doi: 10.1016/j.ultramic.2008.11.022. Epub 2008 Dec 9. Ultramicroscopy. 2009. PMID: 19150751

6

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: verbeeck j. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

7

Direct space structure solution from precession electron diffraction data: Resolving heavy and light scatterers in Pb(13)Mn(9)O(25).

Hadermann J, Abakumov AM, Tsirlin AA, Filonenko VP, Gonnissen J, Tan H, Verbeeck J, Gemmi M, Antipov EV, Rosner H. Hadermann J, et al. Among authors: verbeeck j. Ultramicroscopy. 2010 Jun;110(7):881-90. doi: 10.1016/j.ultramic.2010.03.012. Epub 2010 Mar 31. Ultramicroscopy. 2010. PMID: 20409638

8

Exploring different inelastic projection mechanisms for electron tomography.

Goris B, Bals S, Van den Broek W, Verbeeck J, Van Tendeloo G. Goris B, et al. Among authors: verbeeck j. Ultramicroscopy. 2011 Jul;111(8):1262-7. doi: 10.1016/j.ultramic.2011.02.007. Epub 2011 Mar 1. Ultramicroscopy. 2011. PMID: 21864766

9

Exploiting lens aberrations to create electron-vortex beams.

Clark L, Béché A, Guzzinati G, Lubk A, Mazilu M, Van Boxem R, Verbeeck J. Clark L, et al. Among authors: verbeeck j. Phys Rev Lett. 2013 Aug 9;111(6):064801. doi: 10.1103/PhysRevLett.111.064801. Epub 2013 Aug 8. Phys Rev Lett. 2013. PMID: 23971578

10

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.

Martinez GT, Rosenauer A, De Backer A, Verbeeck J, Van Aert S. Martinez GT, et al. Among authors: verbeeck j. Ultramicroscopy. 2014 Feb;137:12-9. doi: 10.1016/j.ultramic.2013.11.001. Epub 2013 Nov 9. Ultramicroscopy. 2014. PMID: 24270003

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