Point defects in Sc2O3 thin films by ion beam sputtering.
Langston PF, Krous E, Schiltz D, Patel D, Emmert L, Markosyan A, Reagan B, Wernsing K, Xu Y, Sun Z, Route R, Fejer MM, Rocca JJ, Rudolph W, Menoni CS.
Langston PF, et al.
Appl Opt. 2014 Feb 1;53(4):A276-80. doi: 10.1364/AO.53.00A276.
Appl Opt. 2014.
PMID: 24514227