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RC-Effects on the Oxide of SOI MOSFET under Off-State TDDB Degradation: RF Characterization and Modeling.
Micromachines (Basel). 2024 Feb 7;15(2):252. doi: 10.3390/mi15020252.
Micromachines (Basel). 2024.
PMID: 38398980
Free PMC article.
Entropic rigidity of a crumpling network in a randomly folded thin sheet.
Balankin AS, Huerta OS.
Balankin AS, et al. Among authors: huerta os.
Phys Rev E Stat Nonlin Soft Matter Phys. 2008 May;77(5 Pt 1):051124. doi: 10.1103/PhysRevE.77.051124. Epub 2008 May 23.
Phys Rev E Stat Nonlin Soft Matter Phys. 2008.
PMID: 18643043
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Scaling properties of randomly folded plastic sheets.
Balankin AS, Silva IC, Martínez OA, Huerta OS.
Balankin AS, et al. Among authors: huerta os.
Phys Rev E Stat Nonlin Soft Matter Phys. 2007 May;75(5 Pt 1):051117. doi: 10.1103/PhysRevE.75.051117. Epub 2007 May 24.
Phys Rev E Stat Nonlin Soft Matter Phys. 2007.
PMID: 17677032
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Intrinsically anomalous roughness of randomly crumpled thin sheets.
Balankin AS, Huerta OS, Cortes Montes de Oca R, Ochoa DS, Martínez Trinidad J, Mendoza MA.
Balankin AS, et al. Among authors: huerta os.
Phys Rev E Stat Nonlin Soft Matter Phys. 2006 Dec;74(6 Pt 1):061602. doi: 10.1103/PhysRevE.74.061602. Epub 2006 Dec 7.
Phys Rev E Stat Nonlin Soft Matter Phys. 2006.
PMID: 17280073
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