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Edge-by-Edge Lateral Heterostructure through Interfacial Sliding.
Li Z, Zhang L, Liu S, Yang X, Gao W, Chen Y, Leng Y, Lu Z, Ma L, Lu D, Liu X, Duan X, Wang Y, Liao L, Liu Y. Li Z, et al. Among authors: liu y, liu x, liu s. Nano Lett. 2024 Jan 17;24(2):770-776. doi: 10.1021/acs.nanolett.3c04699. Epub 2024 Jan 5. Nano Lett. 2024. PMID: 38180314
Wafer-scale and universal van der Waals metal semiconductor contact.
Kong L, Wu R, Chen Y, Huangfu Y, Liu L, Li W, Lu D, Tao Q, Song W, Li W, Lu Z, Liu X, Li Y, Li Z, Tong W, Ding S, Liu S, Ma L, Ren L, Wang Y, Liao L, Duan X, Liu Y. Kong L, et al. Among authors: liu y, liu x, liu l, liu s. Nat Commun. 2023 Feb 23;14(1):1014. doi: 10.1038/s41467-023-36715-6. Nat Commun. 2023. PMID: 36823424 Free PMC article.
High-Density Vertical Transistors with Pitch Size Down to 20 nm.
Xiao Z, Liu L, Chen Y, Lu Z, Yang X, Gong Z, Li W, Kong L, Ding S, Li Z, Lu D, Ma L, Liu S, Liu X, Liu Y. Xiao Z, et al. Among authors: liu y, liu x, liu l, liu s. Adv Sci (Weinh). 2023 Oct;10(29):e2302760. doi: 10.1002/advs.202302760. Epub 2023 Aug 8. Adv Sci (Weinh). 2023. PMID: 37552811 Free PMC article.
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