Simons DS - Search Results

1

Use of quantum effects as potential qualifying metrics for "quantum grade silicon".

Ramanayaka AN, Tang K, Hagmann JA, Kim HS, Simons DS, Richter CA, Pomeroy JM. Ramanayaka AN, et al. Among authors: simons ds. AIP Adv. 2019;9(12):10.1063/1.5128098. doi: 10.1063/1.5128098. AIP Adv. 2019. PMID: 38680503 Free PMC article.

2

Temperature dependent ²⁹Si incorporation during deposition of highly enriched ²⁸Si films.

Dwyer KJ, Kim HS, Simons DS, Pomeroy JM. Dwyer KJ, et al. Among authors: simons ds. Phys Rev Mater. 2017 Nov;1(6):064603. doi: 10.1103/PhysRevMaterials.1.064603. Epub 2017 Nov 16. Phys Rev Mater. 2017. PMID: 29354799 Free PMC article.

3

A compact, ultra-high vacuum ion source for isotopically enriching and depositing ²⁸Si thin films.

Tang K, Kim HS, Ramanayaka ANR, Simons DS, Pomeroy JM. Tang K, et al. Among authors: simons ds. Rev Sci Instrum. 2019 Aug;90(8):083308. doi: 10.1063/1.5097937. Rev Sci Instrum. 2019. PMID: 31472599 Free PMC article.

4

Targeted enrichment of ²⁸Si thin films for quantum computing.

Tang K, Kim HS, Ramanayaka AN, Simons DS, Pomeroy JM. Tang K, et al. Among authors: simons ds. J Phys Commun. 2020;4(3):https://doi.org/10.1088/2399-6528/ab7b33. J Phys Commun. 2020. PMID: 33043155 Free PMC article.

5

Improved Uranium Particle Analysis by SIMS using O₃ ^- Primary Ions.

Groopman EE, Williamson TL, Simons DS. Groopman EE, et al. Among authors: simons ds. J Anal At Spectrom. 2022;37(10):10.1039/d2ja00231k. doi: 10.1039/d2ja00231k. J Anal At Spectrom. 2022. PMID: 36578831 Free PMC article.

6

Radiochemical neutron activation analysis for certification of ion-implanted phosphorus in silicon.

Paul RL, Simons DS, Guthrie WF, Lu J. Paul RL, et al. Among authors: simons ds. Anal Chem. 2003 Aug 15;75(16):4028-33. doi: 10.1021/ac0342018. Anal Chem. 2003. PMID: 14632114

7

Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometry.

Szakal C, Simons DS, Fassett JD, Fahey AJ. Szakal C, et al. Among authors: simons ds. Analyst. 2019 Jul 21;144(14):4219-4232. doi: 10.1039/c9an00774a. Epub 2019 Jun 14. Analyst. 2019. PMID: 31199423

8

Measurement of uranium-236 in particles by secondary ion mass spectrometry.

Simons DS, Fassett JD. Simons DS, et al. J Anal At Spectrom. 2017 Feb;32(2):393-401. doi: 10.1039/C6JA00402D. Epub 2017 Jan 12. J Anal At Spectrom. 2017. PMID: 28626281 Free PMC article.

9

Uranium Ion Yields from Monodisperse Uranium Oxide Particles.

Sharp N, Fassett JD, Simons DS. Sharp N, et al. Among authors: simons ds. J Vac Sci Technol B Nanotechnol Microelectron. 2016 May-Jun;34(3):03H115. doi: 10.1116/1.4942612. J Vac Sci Technol B Nanotechnol Microelectron. 2016. PMID: 27330850 Free PMC article. No abstract available.

10

Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905).

Marinenko RB, Turner S, Simons DS, Rabb SA, Zeisler RL, Yu LL, Newbury DE, Paul RL, Ritchie NW, Leigh SD, Winchester MR, Richter LJ, Meier DC, Scott KC, Klinedinst D, Small JA. Marinenko RB, et al. Among authors: simons ds. Microsc Microanal. 2010 Feb;16(1):1-12. doi: 10.1017/S1431927609991231. Epub 2009 Dec 24. Microsc Microanal. 2010. PMID: 20030913

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