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Exploring the limits of N-type ultra-shallow junction formation.
Polley CM, Clarke WR, Miwa JA, Scappucci G, Wells JW, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons M. Polley CM, et al. Among authors: bischof mr. ACS Nano. 2013 Jun 25;7(6):5499-505. doi: 10.1021/nn4016407. Epub 2013 May 30. ACS Nano. 2013. PMID: 23721101
Atomically Traceable Nanostructure Fabrication.
Ballard JB, Dick DD, McDonnell SJ, Bischof M, Fu J, Owen JH, Owen WR, Alexander JD, Jaeger DL, Namboodiri P, Fuchs E, Chabal YJ, Wallace RM, Reidy R, Silver RM, Randall JN, Von Ehr J. Ballard JB, et al. J Vis Exp. 2015 Jul 17;(101):e52900. doi: 10.3791/52900. J Vis Exp. 2015. PMID: 26274555 Free PMC article.