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Maskless optical microscope lithography system.
Park ES, Jang D, Lee J, Kim YJ, Na J, Ji H, Choi JW, Kim GT. Park ES, et al. Among authors: kim yj, kim gt. Rev Sci Instrum. 2009 Dec;80(12):126101. doi: 10.1063/1.3266965. Rev Sci Instrum. 2009. PMID: 20059175
Degradation pattern of SnO(2) nanowire field effect transistors.
Na J, Huh J, Park SC, Kim D, Kim DW, Lee JW, Hwang IS, Lee JH, Ha JS, Kim GT. Na J, et al. Among authors: kim dw, kim d, kim gt. Nanotechnology. 2010 Dec 3;21(48):485201. doi: 10.1088/0957-4484/21/48/485201. Epub 2010 Nov 4. Nanotechnology. 2010. PMID: 21051805
303 results