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Sampling-time effects for persistence and survival in step structural fluctuations.
Dougherty DB, Tao C, Bondarchuk O, Cullen WG, Williams ED, Constantin M, Dasgupta C, Das Sarma S. Dougherty DB, et al. Among authors: tao c. Phys Rev E Stat Nonlin Soft Matter Phys. 2005 Feb;71(2 Pt 1):021602. doi: 10.1103/PhysRevE.71.021602. Epub 2005 Feb 23. Phys Rev E Stat Nonlin Soft Matter Phys. 2005. PMID: 15783332
Metal-molecule interface fluctuations.
Tao C, Stasevich TJ, Cullen WG, Einstein TL, Williams ED. Tao C, et al. Nano Lett. 2007 Jun;7(6):1495-9. doi: 10.1021/nl070210a. Epub 2007 Mar 13. Nano Lett. 2007. PMID: 17352508
Generalized survival in step fluctuations.
Tao CG, Cullen WG, Williams ED, Dasgupta C. Tao CG, et al. Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Aug;76(2 Pt 1):021601. doi: 10.1103/PhysRevE.76.021601. Epub 2007 Aug 14. Phys Rev E Stat Nonlin Soft Matter Phys. 2007. PMID: 17930045
Dynamic interfaces in an organic thin film.
Tao C, Liu Q, Riddick BC, Cullen WG, Reutt-Robey J, Weeks JD, Williams ED. Tao C, et al. Proc Natl Acad Sci U S A. 2008 Oct 28;105(43):16418-25. doi: 10.1073/pnas.0805811105. Epub 2008 Sep 2. Proc Natl Acad Sci U S A. 2008. PMID: 18765797 Free PMC article.
Impurity decoration for crystal shape control: C60 on Ag(111).
Stasevich TJ, Tao C, Cullen WG, Williams ED, Einstein TL. Stasevich TJ, et al. Among authors: tao c. Phys Rev Lett. 2009 Feb 27;102(8):085501. doi: 10.1103/PhysRevLett.102.085501. Epub 2009 Feb 27. Phys Rev Lett. 2009. PMID: 19257751
Electrical Stressing Induced Monolayer Vacancy Island Growth on TiSe2.
Zheng H, Valtierra S, Ofori-Opoku N, Chen C, Sun L, Yuan S, Jiao L, Bevan KH, Tao C. Zheng H, et al. Among authors: tao c. Nano Lett. 2018 Mar 14;18(3):2179-2185. doi: 10.1021/acs.nanolett.8b00515. Epub 2018 Feb 23. Nano Lett. 2018. PMID: 29461061
Visualizing Atomic Quantum Defects in Ultrathin 1T-PtTe2.
Ren J, Zhang L, Wang Q, Wang L, Shi Y, Zhou H, Wang A, Zhao D, Hao T, Zhang L, Deng K, Zhang J, Tanigaki K, Tao C. Ren J, et al. Among authors: tao c. J Phys Chem Lett. 2023 May 18;14(19):4554-4559. doi: 10.1021/acs.jpclett.3c00675. Epub 2023 May 9. J Phys Chem Lett. 2023. PMID: 37159549
1,926 results