Scanning electron microscopic and energy-dispersive X-ray analysis findings on two brand new intraocular lenses

N F Schrage; M Reim; W G Burchard; C Teping; M Wenzel

doi:10.1159/000267145

Scanning electron microscopic and energy-dispersive X-ray analysis findings on two brand new intraocular lenses

Ophthalmic Res. 1992;24(1):51-4. doi: 10.1159/000267145.

Authors

N F Schrage¹, M Reim, W G Burchard, C Teping, M Wenzel

Affiliation

¹ Department of Ophthalmology, RWTH Aachen, FRG.

PMID: 1608592
DOI: 10.1159/000267145

Abstract

Two intraocular lenses (IOLs) from the same manufacturer showed surface particles by scanning electron microscopy. With energy-dispersive X-ray analysis, these were shown to contain Mg-Si, Al-Mg-Si, Ti, Fe, Ca and Cu. A sterile chronic intraocular inflammation may result from implantation of such contaminated IOLs.

MeSH terms

Anions / analysis
Cations / analysis
Electron Probe Microanalysis / methods
Lenses, Intraocular*
Microscopy, Electron, Scanning*
Surface Properties

Substances

Anions
Cations