Piezoresponse force microscopy at sub-room temperatures

M Lilienblum; A Hoffmann; E Soergel; P Becker; L Bohatý; M Fiebig

doi:10.1063/1.4801464

Piezoresponse force microscopy at sub-room temperatures

Rev Sci Instrum. 2013 Apr;84(4):043703. doi: 10.1063/1.4801464.

Authors

M Lilienblum¹, A Hoffmann, E Soergel, P Becker, L Bohatý, M Fiebig

Affiliation

¹ Department of Materials, ETH Zurich, Zurich, Switzerland. martin.lilienblum@mat.ethz.ch

PMID: 23635199
DOI: 10.1063/1.4801464

Abstract

Piezoresponse force microscopy is demonstrated at temperatures between -80 °C and +120 °C using a commercial room temperature atomic force microscope upgraded with a home-built cooling/heating-stage. We applied temperature-ramp-synchronized piezoresponse force microscope (PFM) for tracing the temperature dependence of the formation of ferroelectric domains. The potential of our sub-room temperature PFM is demonstrated by investigating the formation and evolution of ferroelectric domains in RbHSO4 as a function of temperature and time, respectively.