Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

J J M Kouwenberg; G J Kremers; J A Slotman; H T Wolterbeek; A B Houtsmuller; A G Denkova; A J J Bos

doi:10.1111/jmi.12686

Alpha particle spectroscopy using FNTD and SIM super-resolution microscopy

J Microsc. 2018 Jun;270(3):326-334. doi: 10.1111/jmi.12686. Epub 2018 Feb 2.

Authors

J J M Kouwenberg¹, G J Kremers², J A Slotman², H T Wolterbeek¹, A B Houtsmuller², A G Denkova¹, A J J Bos¹

Affiliations

¹ Radiation, Science & Technology, Technische Universiteit Delft Faculteit Technische Natuurwetenschappen, Mekelweg 15, Delft, the Netherlands.
² Erasmus Optical Imaging Centre, Erasmus MC, 's-Gravendijkwal 230, Rotterdam, the Netherlands.

PMID: 29393521
DOI: 10.1111/jmi.12686

Abstract

Structured illumination microscopy (SIM) for the imaging of alpha particle tracks in fluorescent nuclear track detectors (FNTD) was evaluated and compared to confocal laser scanning microscopy (CLSM). FNTDs were irradiated with an external alpha source and imaged using both methodologies. SIM imaging resulted in improved resolution, without increase in scan time. Alpha particle energy estimation based on the track length, direction and intensity produced results in good agreement with the expected alpha particle energy distribution. A pronounced difference was seen in the spatial scattering of alpha particles in the detectors, where SIM showed an almost 50% reduction compared to CLSM. The improved resolution of SIM allows for more detailed studies of the tracks induced by ionising particles. The combination of SIM and FNTDs for alpha radiation paves the way for affordable and fast alpha spectroscopy and dosimetry.

Keywords: Alpha radiation; FNTD; SIM.

Publication types

Research Support, Non-U.S. Gov't