Study on dark-field imaging with a laboratory x-ray source: Random stress variation analysis based on x-ray grating interferometry

Seho Lee; Ohsung Oh; Youngju Kim; Daeseung Kim; Junhyeok Won; Seung Wook Lee

doi:10.1063/5.0011619

Study on dark-field imaging with a laboratory x-ray source: Random stress variation analysis based on x-ray grating interferometry

Rev Sci Instrum. 2021 Jan 1;92(1):015103. doi: 10.1063/5.0011619.

Authors

Seho Lee¹, Ohsung Oh¹, Youngju Kim¹, Daeseung Kim¹, Junhyeok Won¹, Seung Wook Lee¹

Affiliation

¹ School of Mechanical Engineering, Pusan National University, Busan 46241, South Korea.

PMID: 33514223
DOI: 10.1063/5.0011619

Abstract

The dark-field image (DFI) in a grating interferometer involves the small-angle scattering properties of a material. The microstructure of the material can be characterized by an analysis of the auto-correlation length and the DFI. The feasibility of a DFI in a laboratory x-ray source with grating interferometry has been reported, but a follow-up study is needed. In this study, the random stress distribution was measured in the laboratory environment as an applied study. SiO₂ mono-spheres as a cohesive powder with a 0.5 µm particle size were used as the sample. The microstructural changes according to the stresses on the particles were observed by acquiring a DFI along the auto-correlation length. In x-rays, a random two-phase media model was first used to analyze the characteristics of cohesive powder. This study showed that the microstructure of materials and x-ray images could be analyzed in a laboratory environment.