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Integrated fluorescence and transmission electron microscopy.
Agronskaia AV, Valentijn JA, van Driel LF, Schneijdenberg CT, Humbel BM, van Bergen en Henegouwen PM, Verkleij AJ, Koster AJ, Gerritsen HC. Agronskaia AV, et al. Among authors: schneijdenberg ct. J Struct Biol. 2008 Nov;164(2):183-9. doi: 10.1016/j.jsb.2008.07.003. Epub 2008 Jul 11. J Struct Biol. 2008. PMID: 18664385
Extremely thin layer plastification for focused-ion beam scanning electron microscopy: an improved method to study cell surfaces and organelles of cultured cells.
VAN Donselaar EG, Dorresteijn B, Popov-Čeleketić D, VAN DE Wetering WJ, Verrips TC, Boekhout T, Schneijdenberg CTWM, Xenaki AT, VAN DER Krift TP, Müller WH. VAN Donselaar EG, et al. Among authors: schneijdenberg ctwm. J Microsc. 2018 Jun;270(3):359-373. doi: 10.1111/jmi.12694. Epub 2018 Mar 25. J Microsc. 2018. PMID: 29574724
16 results