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Extremely thin layer plastification for focused-ion beam scanning electron microscopy: an improved method to study cell surfaces and organelles of cultured cells.
VAN Donselaar EG, Dorresteijn B, Popov-Čeleketić D, VAN DE Wetering WJ, Verrips TC, Boekhout T, Schneijdenberg CTWM, Xenaki AT, VAN DER Krift TP, Müller WH. VAN Donselaar EG, et al. Among authors: muller wh. J Microsc. 2018 Jun;270(3):359-373. doi: 10.1111/jmi.12694. Epub 2018 Mar 25. J Microsc. 2018. PMID: 29574724
225 results