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Design and operation of a differentially pumped environmental chamber for the HVEM.
Ultramicroscopy. 1981;6(3):267-79. doi: 10.1016/s0304-3991(81)80162-3.
Ultramicroscopy. 1981.
PMID: 7281366
EDX and EELS in the high-voltage electron microscope: localization of elements in thick specimens.
Tivol WF, Ratkowski AJ, Parsons DF.
Tivol WF, et al. Among authors: ratkowski aj.
Neurotoxicology. 1983 Fall;4(3):161-3.
Neurotoxicology. 1983.
PMID: 6686304
No abstract available.
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Adaptation of a high-voltage electron microscope for routine biological dark-field imaging.
Mannella CA, Ratkowski AJ.
Mannella CA, et al. Among authors: ratkowski aj.
Ultramicroscopy. 1983;11(1):21-34. doi: 10.1016/0304-3991(83)90052-9.
Ultramicroscopy. 1983.
PMID: 6193625
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