Improving the precision of optical metrology by detecting fewer photons with biased weak measurement.
Yin P, Zhang WH, Xu L, Liu ZG, Zhuang WF, Chen L, Gong M, Ma Y, Peng XX, Li GC, Xu JS, Zhou ZQ, Zhang L, Chen G, Li CF, Guo GC.
Yin P, et al. Among authors: xu l, xu js.
Light Sci Appl. 2021 May 17;10(1):103. doi: 10.1038/s41377-021-00543-4.
Light Sci Appl. 2021.
PMID: 34001846
Free PMC article.